详情
1.1Basic product information
|
Product number
|
ST***3
|
|
Performance indicators
|
|
|
Monitor
|
HD LED digital display
|
|
Display digits
|
4bit
|
|
Resistivity measurement
|
|
Basic accuracy
|
0.5%
|
|
Measurement range
|
1×*0^*4~2×*0^5Ω-cm
|
|
Measurement mode
|
Spot test
|
|
Square resistance measurement
|
|
Basic accuracy
|
0.5%
|
|
Measurement range
|
5×*0^*4~1×*0^6Ω/
|
|
Measurement mode
|
Spot test
|
|
Measurement function
|
|
Range mode
|
Automatic,keep
|
|
Measuring speed
|
5 times/sec
|
|
Trigger mode
|
Automatic manual
|
|
Interface configuration
|
USB Device
|
|
General specifications
|
|
Operating environment
|
0ºC**0ºC,≤*0%RH
|
|
Guaranteed accuracy environment
|
*3±5ºC,≤*0%RH
|
|
Power requirement
|
**0V±*0%(AC),*0Hz
|
|
Power consumption
|
|
|
Size and weight
|
**0mm(length)×**5mm(width)×**0mm(height),2.5kg
|
2.1 basic functions and standards:
St***3 digital four probe tester is a multi-purpose and intelligent
comprehensive measuring instrument which uses the principle of four
probe to measure the resistivity / block resistance of materials.
The instrument is designed in accordance with GB / T ********9
method for the determination of resistivity of single crystal
silicon, GB / T ********5 DC two probe method for the determination
of resistivity of single crystal silicon and germanium, GB / T
********5 DC four probe method for the determination of resistivity
of single crystal silicon and germanium and other national
standards, as well as American a.s.t.m standards.
2.2 complete set of instrument: it is composed of st***3 four probe
host, optional four probe probe, four probe test bench and st***3
four probe test software.
2.3 advantages:
1) with computer software, it can save, query, statistical analysis
data and print reports.
2) USB communication interface, good universality, convenient and
fast. Better than RS**2 or **5 mode, these ports are generally
difficult to match the computer!
3) *-gear ultra wide range, leading in the industry. Generally,
there are five to six gears in the same industry.
4) it can be operated by a single computer, miniaturized and
integrated manually / automatically.
5) it is easy to operate and stable in performance. Digital switch
is used for all parameter setting and function conversion,
which is simple and reliable and free from the instability of
analog potentiometer.
2.4 selection of probe: according to the requirements of different
material characteristics, the probe can be selected from several
types. For details, please refer to the model, specification and
feature selection reference table of four probe probe
1) equipped with high wear-resistant tungsten carbide probe, such
as st****-f*1, to test the resistivity / square resistance of
silicon and other semiconductor, metal, conductive plastic and
other hard materials;
2) spherical or flat head gold-plated copper alloy probe with no
film damage, such as st***8b-f*1, can be used to measure the
conductive film such as metal foil, carbon paper, etc., as well as
the conductive coating film on ceramic, glass or PE film, such as
metal coating, spraying film, ITO film, capacitance convolution
film, etc.
3) it is equipped with special foil coating probe, such as
st***8b-f*2, which can also test the coating resistivity / square
resistance of lithium battery pole piece and other foil.
4) replace the four terminal test fixture, and measure the body
resistance of the resistor.
2.5 selection of test bench: according to the needs of different
material characteristics, the test bench can have multiple options.
For details, please refer to the model, specification and feature
selection reference table of four probe tester
Szt-a or szt-b (electric) or szt-c (fast constant voltage) or szt-f
(solar cell) test bench is selected for solid or thin film material
test by four probe method.
SZT - K test bench is selected for the two - probe method
Szt-g test bench is selected for parallel four knife test of rubber
and plastic materials.
2.6 scope of application: the instrument is applicable to the
measurement of conductivity of conductor, semiconductor and
semi-conductor like materials by four probe method in semiconductor
material factory, scientific research institute and colleges and
universities.
III. basic technical parameters
3.1 measurement range
Resistance: 1 × *0^*4 ~ 2 × *0^5 Ω, resolution: 1 × *0^*5 ~ 1 ×
*0^2 Ω
Resistivity: 1 × *0^*4 ~ 2 × *0^5 Ω - cm, resolution: 1 × *0^*5 ~ 1
× *0^2 Ω - CM
Square resistance: 5 × *0^*4 ~ 1 × *0^6 Ω / , resolution: 5 × *0^*5
~ 1 × *0^2 Ω /
3.2 material size (determined by optional test bench and test
method)
Diameter: direct test method of szt-b / C / F test bench is **0mm ×
**0mm, and handheld method is not limited
Length (height): direct test mode of test bench h ≤ **0mm, no limit
to handheld mode
Measuring direction: both axial and radial
3.4 four probe probe (select one or add all)
(1) tungsten carbide probe: Φ 0.5mm, linear probe spacing 1.0mm,
probe pressure **2kg adjustable
(2) membrane square resistance probe: Φ 0.7mm, linear or square
probe spacing: 2.0mm, probe pressure: **0.6kg adjustable
3.5. power supply
Input: AC **0V ± *0%, *0Hz power consumption: < *0W
3.6. Overall dimension and weight:
Host: **0mm (L) × **5mm (W) × **0mm (H), net weight: ≤ 2.5kg
| 国家: |
China |
| 型号: |
ST2253
|
| 离岸价格: |
2580 ~ 2620 / Set （面議）
获取最新报价
|
| 位置: |
No. 18, Xin Men Road, Wuzhong District, Suzhou, Ji |
| 最小订单价格: |
2580 per Set |
| 最小订单: |
- |
| 包装细节: |
- |
| 交货时间: |
- |
| 供应能力: |
10 Set per Day |
| 付款方式: |
T/T, L/C, D/A, D/P, Western Union, Money Gram, PayPal |
| 產品組 : |
four-point probes tester
|
