Metrology Equipment(CD-SEM. FESEM, SEM, FIB) Global Nanotech
Equipment provides high qualitynew Material and Lab Equipment,
used, 2nd hand, rebuilt and refurbished Metrology Equipment(CD-SEM.
FESEM, SEM, FIB), Electronic Test Equipment and other semiconductor
equipment , quartz, ceramic, silicon carbide, silicon parts.
(http://*****; *****) Our used Metrology Equipment is fully
reconditioned to meet or exceed OEM specifications and carried out
by our qualified engineers with many years of experience working
for ***** more than 40 years of knowledge and experience in CD-SEM.
FESEM, SEM, FIB, we refurbish many types of CD-SEM. FESEM, SEM, FIB
used Metrology Equipment, including Refurbished Hitachi CD-SEM
model S-8840, Hitachi CD-SEM model S-8820, Hitachi CD-SEM model
S-9220, Hitachi CD-SEM model S-9260, Hitachi CD-SEM model S-9300,
Hitachi FE-SEM model S-4500, Hitachi FE-SEM model S-4700, Hitachi
FE-SEM model S-4160, Hitachi SEM S-2500ci, Hitachi SEM S-2300,
Hitachi SEM S-2150, Hitachi SEM S800, Hitachi SEM S-570, JEOL
JSM-840, LEO 1550 Field Emission SEM, LEO FE-SEM model 982, Micrion
FIB model M9500 .We also provide new Energy Dispersive X- Ray
Spectrometer QUANTAX 200 , XFlash 5010 Detector combined with the
used SEM for our valuable customers. Global Nanotech Equipment also
provides the following semiconductor equipment: • Refurbished KLA
2135 Defect Inspection System; • Refurbished KLA-Tencor 6220
Surfscan; • Refurbished KLA-Tencor 6420 Surfscan; • Refurbished
KLA-Tencor 5200XP Overlay Registration System; • Refurbished
DAINIPPON 60A coater / developer ; • Refurbished other
semiconductor equipment; • Used semiconductor equipment ;