Metrology Equipment(CD-SEM. FESEM, SEM, FIB) Global Nanotech Equipment provides high qualitynew Material and Lab Equipment, used, 2nd hand, rebuilt and refurbished Metrology Equipment(CD-SEM. FESEM, SEM, FIB), Electronic Test Equipment and other semiconductor equipment , quartz, ceramic, silicon carbide, silicon parts. (http://*****; *****) Our used Metrology Equipment is fully reconditioned to meet or exceed OEM specifications and carried out by our qualified engineers with many years of experience working for ***** more than 40 years of knowledge and experience in CD-SEM. FESEM, SEM, FIB, we refurbish many types of CD-SEM. FESEM, SEM, FIB used Metrology Equipment, including Refurbished Hitachi CD-SEM model S-8840, Hitachi CD-SEM model S-8820, Hitachi CD-SEM model S-9220, Hitachi CD-SEM model S-9260, Hitachi CD-SEM model S-9300, Hitachi FE-SEM model S-4500, Hitachi FE-SEM model S-4700, Hitachi FE-SEM model S-4160, Hitachi SEM S-2500ci, Hitachi SEM S-2300, Hitachi SEM S-2150, Hitachi SEM S800, Hitachi SEM S-570, JEOL JSM-840, LEO 1550 Field Emission SEM, LEO FE-SEM model 982, Micrion FIB model M9500 .We also provide new Energy Dispersive X- Ray Spectrometer QUANTAX 200 , XFlash 5010 Detector combined with the used SEM for our valuable customers. Global Nanotech Equipment also provides the following semiconductor equipment: • Refurbished KLA 2135 Defect Inspection System; • Refurbished KLA-Tencor 6220 Surfscan; • Refurbished KLA-Tencor 6420 Surfscan; • Refurbished KLA-Tencor 5200XP Overlay Registration System; • Refurbished DAINIPPON 60A coater / developer ; • Refurbished other semiconductor equipment; • Used semiconductor equipment ;