详情
1)The
main engine uses the world leading advanced circuit design the
measured value is more precise, faster, more accurate (generation
of traditional-style circuit, Disadvantages: bulky, slow, leading
many components which affect life expectancy)
2) LCR
display (generation to
only digital tube display), automatic is standard, manual is
optional
3)Matching computer interface and
software (there are **2 interface and USB two kinds of interfaces)
to allow easy operation and clear of (can be directly connected to
a computer, the computer automatically calculate based on the input
to the specified thickness, automatic mutatis mutandis, and the
correction factor, so that the measured results of more accurate
data can be stored or deleted, which will help to save the use of
party records).
4)Second-generation test
rackusedautomatic sensing device, close to
the measured object by implementing the automatic deceleration,
avoiding the loss of the detected objects and probe wear and tear
(advanced
toany similar
products in the domestic market in a test stand,
the older generation to Manual).
5)The instrument test resistance,
resistivity, sheet resistance, the standardized
coefficientsof the machine comes with
self-tuning,
noneed for
additional manual adjustments,
6)The maximum resolution of this
instrument is 0.1m&branded;.
7)The test probe is the tungsten
needle, in the market many probes are the high speed steel
needle.
8)Each
time the survey has the built-in computer to carry on the
temperature compensation and the voltage electric current
correction automatically
9) Overall measurement standard uncertainty: <=
2% (domestic other factory error is <= 5%)
*0) Specifications
***Measuring range:
Resistivity*0 *4 ~
**5&branded;/cm
sheet resistance*0 *4 ~
**5&branded;/□
resinstance*0 *4 ~ **5&branded;
***Observable semiconducting material
size
diameter5mm***0mm
length≤**0mm
*** measuring method
Axial, the cross section may
***Display:
*1 / 2, digital display, polarity, overload
auto-show, a decimal point, the unit automatically
displayed.
*** constant current
source
(1)Electric current
output: Direct current 0~**0 mA continuously
adjustable.
(2) range:*0,**0μA,1,*0,**0mA
(3) Error: ±0.5% readingdate±1
***Four probe test probe
(1) probe space:1mm
(2) Material: Tungsten carbide. Probe machinery vacillation rate:
±1.0%
***Power source:
**0±*0% *0Hz or *0Hz power loss:
<*5W
SZT*2A have 2 kinds of price, one is normal, another with computer
Interface (USB and **2) to function when the silicon thickness
<1mm readings automatically amended so that the measured data
accuracy rate will be **0%. The test date was automatically
generated excel form can be printed east, and also easy to save and
delete.
