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BT 2003 Particlce Size Analyzer

BT 2003 Particlce Size Analyzer

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位置:

Boston, MA

最小订单价格:

-

最小订单:

1

包装细节:

-

交货时间:

-

供应能力:

-

付款方式:

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联系人 Mr. Angstrom

95 Mill Street, Stoughton, Massachusetts

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详情

Introduction Particle sizing is a critical production process. Particle size distribution is significant for quality control, quality assurance and performance testing. Examples of this can include: catalyst on catalytic result; cement curing time and ultimate strength; mineral composition and quality and performance; for coating effect and surface luster for painting applications; for determining medicinal taste, absorption rate and curative effect, etc. Therefore effective particle size distribution control in powder processing is priority number one for quality assurance, public health and safety, reduction of energy consumption and control of product waste. Therefore effective control on particle size distribution in powder processing and application is important for quality improvement, protection of public health, reduction of energy consumption and control of environment pollution. BT****3 laser particle size analyzer (LPSA) is a new model particle size analyzer working on the basis of laser scattering theory. It includes analyzer itself, sample preparation device and computer system, etc. Sample is carried to the testing zone in analyzer by sample preparation device, after laser illumination, scattered light signals are detected and transformed into an electric signal. This signal is then transmitted to the computer by USB or RS**2 to be processed by special particle size test software on the basis of Mie theory to obtain result of particle size distribution. Features * Advanced manufacturing techniques makes the instrument compact, graceful in appearance and thus convenient for use and maintenance. Effective anti-interference technology improves electrical stability and reduces fault rate. * Two sample feeding modes: small cell and automatic circulating & dispersing system (ACDS). Selectable by the user with easy replacement. * Mie scattering and Fraunhoffer diffraction theories are applied in data processing. Both include R-R distribution an

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Mr. Angstrom < Angstrom Advanced >

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