ADX****0 X-ray Diffraction Instrument is designed for application
in the microstructure measurement, testing and in-depth research
investigations. With different accessories and the corresponding
control and calculating software,ADX****0 is a diffraction system
according to the practical requirements in many
fields.
ADX****0 X-ray Diffraction Instrument provides the structure
analysis of single crystal, polycrystalline and amorphous
sample.ADX****0 is capable of the following: phase qualitative
analysis and quantitative analysis (RIR, Internal standard
calibration, External standard calibration, Additive criterion),
pattern indexing, unit cell determination and refinement,
crystallite size and strain determination, profile fitting and
structure refinement, residual stress determination, texture
analysis(ODF expresses three-dimensional pole figure),
crystallinity estimate from peak areas, thin film analysis and
others.