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AIS2300

AIS2300

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联系人 Mr. Angstrom

95 Mill Street, Stoughton, Massachusetts

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详情

AIS***0 excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. This instrument features a perfect balance between stable configuration and an excellent resolution. Angstrom-SEM clearly shows Angstrom�s state-of-art technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom-SEM pursues compact SEM design which is great for office environment. Angstrom-SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.

High Performance

  • Field proven image quality
  • Upgraded scan speed and pixel resolution.
  • Wide variety of optional instrument
  • Resolution : 3.0 nm
  • Magnification : ~1,**0,**0X
  • Display : Photo ***6X ***6
  • Search : **0X**0 *0fps
  • Options : BSE / WDS / EDS / EBSD / Etc.

Gun Coumn

  • Gun design for stable current supply
  • Dual field objective lens for spherical
  • Aberration reduction
  • Movable aperture for beam centering
  • Upgraded design of magnetic lens (CL/OL)

Chamber & Stage

  • 5 axis eucentric stage
  • Option: Stage motorization
  • EDS,WDS,CCD, Manipulator etc
  • *0X*0X*7mm

Detector

  • ET-bar type SE detector
  • SE & BSE double image mode
  • Option: BSE detector

GUI

  • Window based GUI
  • PC controlled operation
  • Image thumbnail & storage
  • Parameter Display

Vacuum System

  • Automatic & Manual control
  • Automatic Safety System
  • R.P+D.P/ R.P+TMP

Image Analyzer

  • Data transfer to Excel
  • Particle counter for blob analysis
  • Multi-focusing & Tiling
  • 3D data view etc

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Mr. Angstrom < Angstrom Advanced >

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