Multi-function: AFM, LFM, STM, Conductive AFM, MFM and
EFM;�
Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and
Lifting Mode;�
SPM can be in liquid;�
Real-time temperature and humidity detecting;�
Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude
Curve;�
Nano-Processing and manipulating: Lithography Mode and Vector Scan
Mode;�
Fast automatically tip-engaging�
Simply change of the tip holder to switch between STM and
AFM;�
Full digital control, auto system status
recognition;�
Adjustable lightening inside�
With a **-bit Digital Signal Processor (DSP) from Texas
Instruments, 4.8 billion times of calculation per second can be
achieved;
Controller and Computer connected through a *0M/**0M Fast
Ethernet;
Large sample size: up to diameter *5mm, *0mm
thick;�
Online Control Software and offline Image Processing Software for
Windows;�
Trace-Retrace scan, Back-Forward scan;�
Online real-time 3D image;�
Automatically Brightness and Contrast refresh;�
Data can be loaded out for further analysis;
Nano-Movie function: Continuous data collection, storage and
replay;�
Multi-Analysis: Granularity and Roughness;
Tip Estimation and Image Re-construction;�
Modularized design for convenience of maintenance and future
upgrade;
Second display monitor and optical microscope system
attachable;
