|
System Specifications
Adopt ballistic method measurement, technical indices as
follows:
|
Parameters measured
|
Bs (%)
|
Br (%)
|
Hc (%)
|
Pu (%)
|
μ m (%)
|
μ i (%)
|
|
Uncertainty (k = 2)
|
1
|
1
|
1.5
|
1
|
2
|
5
|
|
Repeatability (constant temperature)
|
± 0.5
|
± 0.5
|
± 0.5
|
± 0.5
|
± 1
|
± 3
|
When testing hysteresis loop with scanning method, H and
B measuring errors can be estimated as:
B: 1% + 1/2 LSB
H: 1% + 1/2 LSB
Instrument Specifications
|
MATS - ***0SD Static Hysteresisgraph
|
|
PC***6 A/D D/A Card
|
Output Voltage: 0 ~ ±*5 V
Output Current: 0.*1 mA ~ *0
A
Current Range: 1 mA, 2 mA, 5 mA,
*0 mA, *0 mA, *0 mA, **0 mA, **0 mA,
**0 mA, 1 A, 2 A, 5 A, *0 A total *3 automatic
ranges
Stability: superior to 0.*5%
Flux Range: 0.*5, 0.5, 1, 2, 5,
*0, *0 mWb, total seven automatic ranges
Sensitivity: 0.*5 μWb (ballistic
method)
0.1 μWb (magnetic field sweep)
|
A / D Conversion: *6
bits, 8 channels differential
Conversion Time: < *0 μs
Conversion Accuracy: 0.*1% (full
range)
D/A Conversion: *6 bits, 2
channels
Conversion Accuracy: 0.*1% (full
range)
Bus Structure: PCI busbar
|
|
