EDX800 XRF Spectrometer

详情

Technical specifications

Measurable elements: Au, Ag, Cu, etc
Measurement Precision (Standard Deviation Statistic): 0.*5%~0.1% ( main element content over than *6%)
                                                                                                    0.*1um~0.*5um (for coating element analysis)
Tube voltage: ***0KV
Tube current: ******0μA
Test time: *0~**0s
Ambient humidity: <=*0%
Power: AC**0V**5V/AC**0V**5V( AC purified stabilized voltage power supply is recommended)

Standard configurations

Single sample chamber
Laser positioning device
Proportional counter
Signal detection electronic circuit
High and low voltage power supplies
X-ray tube

Application fields

Content determination of precious metals Au, Pt, Ag, etc and jewelries
Thickness measurement of metal plating and content determination of plating solutions and plating
Precious metals and jewelries processing industries, banks, jewelries shops and testing centers, plating industries