AA8000 Multi-Function SEM System

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国家:

USA

型号:

AA8000

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（面議）获取最新报价

位置:

最小订单价格:

最小订单:

1 Unit

包装细节:

insulated wooden crate

交货时间:

供应能力:

付款方式:

產品組 :

Atomic Force Microscope

现在联系

Angstrom Advanced

USA

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This product is also available on Amazon for retail.

联系人 Mr. Angstrom

95 Mill Street, Stoughton, Massachusetts

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产品规格

Brand Name: Angstrom Advanced

详情

IntroductionsAngstrom AA****-SEM is a true multi-purpose, multi-user instrument. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. This instrument features a perfect balance between stable configuration and an excellent resolution. Angstrom-SEM clearly shows Angstrom’s state-of-art technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom-SEM pursues compact SEM design which is great for office environment. Angstrom-SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.Features

High Performance

Field proven image quality
Upgraded scan speed and pixel resolution.
Wide variety of optional instrument
Resolution : 3.0 nm
Magnification : ~1,**0,**0X
Display : Photo ***6X ***6
Search : **0X**0 *0fps
Options : BSE / WDS / EDS / EBSD / Etc.

Gun Coumn

Gun design for stable current supply
Dual field objective lens for spherical
Aberration reduction
Movable aperture for beam centering
Upgraded design of magnetic lens (CL/OL)

Chamber & Stage

5 axis eucentric stage
Option: Stage motorization
EDS,WDS,CCD, Manipulator etc
*0X*0X*7mm

Detector

ET-bar type SE detector
SE & BSE double image mode
Option: BSE detector

GUI

Window based GUI
PC controlled operation
Image thumbnail & storage
Parameter Display

Vacuum System

Automatic & Manual control
Automatic Safety System
R.P+D.P/ R.P+TMP

Image Analyzer

Data transfer to Excel
Particle counter for blob analysis
Multi-focusing & Tiling
3D data view etc

Specifications

Z ELECTRON OPTIC SYSTEM

Resolution	3.0 nm @*0KeV SE/ 4.0nm @BSE
Magnification	0 ~ 1,0,*0X
Image	Color Optical Microscope Image (Option)
Beam Scan Mode	Search, Inspection, Photo (3step)
Accelerating Voltage	0.5kV~*0kV
Electron Gun Type	Tungsten Filament
Bias System	Linked with Acc. Voltage plus continuous voltage control
Gun Alignment	Pre-centered cartridge
Condenser Lens	Electromagnetic 2 stages
Objective Lens	Electromagnetic 1 stages
Stigmator	8 Pole Electromagnetic Type
Detector	Bar Type SE Detector (SE-BSE Conversion Mode Without BSE detector for Non-coating sample inspection)
Image Shift	4 Pole Electromagnetic Type
Automation Function	Auto-Focus, Auto-Stigmatism, Auto Contrast/Brightness, Emission Current etc.

DISPLAY

Frame Memory &Scan

Search (**0X**0) >*0 frame/s

Inspection (***0X**0) *0 frame/s

Photo(***6X***6) 2 frame/s

IMAGE ANALYZER

Image Analyzer Particle Counter	Multi-Focusing/ Image Tiling/ 3D-View/Enhancement/ Color Transformation/Filters/ Blob Analysis (Single/Multiple/Grouping), Histogram, Excel Data, Point Measurement

STAGE SYSTEM

Movement (X/Y/Z) mm	0/ 0/ *7mm
Tilt	*0~0° (Max *0 °)
Rotation	**0°
Stage Motorization	X,Y,R (Standard) X,Y,Z,Tilt,Rotation (Option)

VACUUM SYSTEM

Vacuum Control Type	Full automation with safety system
Vacuum System	Rotary Pump + Diffusion Pump or Rotary Pump + Turbo Pump (Option)

CONTROL SYSTEM

Computer System	Intel Pentium 4(Dual Co-Processor)
Memory	≥ **6MB, Control Data Interface
Operation System	Image Acquisition

国家:	USA
型号:	AA8000
离岸价格:	（面議）获取最新报价
位置:	-
最小订单价格:	-
最小订单:	1 Unit
包装细节:	insulated wooden crate
交货时间:	-
供应能力:	-
付款方式:	-
產品組 :	Atomic Force Microscope