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Introduction
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ADX2700 θθ Powder Xray Diffraction Instrument is
multifunction diffractometer with exceptional analysis
speed, reliability and reproducibility. The ADX2700 is
a diffraction instrument designed for the challenges of
modern materials research. ADX2700 can analyze powders,
liquids, thin films, nanomaterials and many other
different materials. The ADX2700 can be used for many
different applications: Academic, Pharmaceuticals,
Chemical & Petrochemical, Material Research, Thin
Film Metrology, Nano technology, Food & Cosmetics,
Forensics, Mining & Minerals, Metals, Plastics
& Polymers, etc.
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Features
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Computed tomography, Highresolution Xray diffraction,
High throughput screening, Inplane diffraction,
Crystallite size and microstrain analysis,
Microdiffraction, Nonambient diffraction, Pair
distribution function analysis, Phase identification,
Phase quantification, Reflectivity analysis, Residual
stress analysis,
Crystallography, Texture analysis, Transmission, Thin
film analysis.
ADXDWZ Combination of Eulerian cradle for stress and
texture investigations, Thin film and Quantity
Analysis attachment with control and analysis
software with alignmentfree
feature.
ADCX sample changer is compact and rugged. Integrated
spinning improves particle statistics in
polycrystalline sample measurements. Fully automatic
alignment. Programmable
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Accessories
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AHTK 1000 high temperature attachment
Automated variable temperature stage for Xray
diffraction measurements of materials at elevated
temperatures (room temperature1200°C). The stage may
be operated in vacuum. The sample is heated radiantly
for reduced heat gradients within the sample.
Automated z translation within the stage assures
precise sample positioning even in the presence of
thermal expansion of the sample.
ALTK450 Variable temperature
attachment
Automated variable temperature stage for Xray
diffraction measurements of crystal structure
(193°C450°C). The stage can be operated under liquid
nitrogen cooling conditions..
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Software
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General diffraction data processing: automatic peak
search, manual peak search, integral intensity,
separation of Kα1,α2, background remove, pattern
smoothing and magnifying, mulriple plot,
threedimensional plot and simulation of XRD pattern.
- Qualitative Analysis: The data processing software
has the search and match function on the base of whole
profile and diffraction angle. The whole profile
matching procedure employs the designed mode to do the
qualitative analysis by reducing the search range from
major, minor, to micro phase without indicating the
diffraction angle. The diffraction angle matching
procedure is based on the peaks position and intensity
and usually used for the qualitative analysis of the
data with large angle error.
- Quantitative Analysis: After the phase composition
is determined, the content of each phase could be
calculated with the help of RIR or/and the Rietveld
refinement (Quantitative Analysis without criterion)
- Plot and Export: The data processing software is
operated within the Windows interface. The preparing
exported pattern could be labeled, zoomed in, zoomed
out and also copied and pasted.
- Phase identification, structure analysis, Thin film
analysis, stress investigation, Texture analysis are
all available
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Parts and Specifications
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Xray Generator
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Control mode
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1kV/step, 1mA/step controlled by PC
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Rated output power
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4 kW
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Tube voltage
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1060 kV 1kV continuously adjustable
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Tube current
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580 mA continuously adjustable
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Xray tube
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Cu, Fe, Co, Cr, Mo et al (2 kW)
Focus dimension: 1×10 mm2 or 0.4×10 mm2
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Stability
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≤ 0.0005% mains fluctuation
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Goniometer
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Goniometer
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theta(θ)/theta(θ)
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Diffraction circle semidiameter
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285mm
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Scan range of θ
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3° to +160°
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Continuous scanning speed
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0.00696°/min
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Setting speed of angle
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1500°/min
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Scan mode
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θθ or θ, θ; Continuous or step scanning
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One way repeatability of θ
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≤ 0.0002°
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precision of θd or θs
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≤0.005°
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Minimal stepping angle
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0.0001°
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Record Unit
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Counter
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PC or SC
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Maximal CPS
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5x10^6 CPS
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Proportion counter energy spectrum resolution
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≤ 25%(PC), ≤ 50%(SC)
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Detectable high voltage
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15002100 continuous tune
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High voltage of the counter
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differential or integral, automatic PHA, dead
time emendation
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ADXDWZ
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System detector stability
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≤ 0.01%
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Micro Structure
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Micro Structure analysis, +/0.5nm
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MicroDiffraction
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Micro sample or area, 2nm19 um
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Integrated performance
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Dispersion dosage
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≤ 1μSv/h
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Integrated stability of the system
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≤ 0.5%
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Dimension
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1000 × 800 × 1640 mm
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