Trace metallic levels reported **0 parts-per-billion or
less.
Certified for particles down to 1.0micron.
Exceeds SEMI C1 C2 standard.
Meets requirements for IC devices with critical geometries
2.0micron.
| 国家: | China |
| 型号: | EL grade |
| 离岸价格: | 获取最新报价 |
| 位置: | - |
| 最小订单价格: | - |
| 最小订单: | - |
| 包装细节: | - |
| 交货时间: | - |
| 供应能力: | - |
| 付款方式: | - |
| 產品組 : | - |
