Meets requirements for IC devices with critical geometries between 0.*5and 0.8micron. Trace metallic levels reported 1 parts-per-billion or less. Certified for particles down to 0.2micron and filtered through 0.*5micron media. Packaged into high-purity containers clean-rooms using closed-filled systems. Exceeds SEMI C8 standard.
国家: | China |
型号: | UP-S grade |
离岸价格: | 获取最新报价 |
位置: | - |
最小订单价格: | - |
最小订单: | - |
包装细节: | - |
交货时间: | - |
供应能力: | - |
付款方式: | - |
產品組 : | - |